An analysis of occupational injury and illness reports in the semiconductor manufacturing industry during 1984.

Details

• Personal Author:
  Lassiter DV ; McCurdy SA ; Schenker MB
• Description:
  The Semiconductor Industry Association (SIA) sponsored the development of a reporting system for participating members, called the Occupational Health System (OHS). All cases reported on the OSHA-200 were entered in the OHS database and supplementary information relating to job description, circumstances of injury or illness, and the number of lost or restricted work days was also included. The data were analyzed yearly. An evaluation was made of the OHS with respect to accuracy, usefulness, and future potential. Those evaluating the System were expert in the fields of epidemiology, industrial hygiene, toxicology and occupational health. Data were taken from the 1984 findings, in which 37 recording sites representing 16 manufacturing firms participated in the OHS. The most important factor affecting the score on the clinical vignette section was the duration of employment for the respondent. The experts recommended that on going quality control systems for the OHS data should be developed at all levels of data handling; that illness and injury coding classification indicating how cases were recorded should be added to the database; that an unambiguous system be instituted for coding missing data; that annual OHS reports should add data on illnesses and injuries that address their health significance; terms for coding should be narrowed; and unique identifiers such as social security system number and birth data should be added to the records. [Description provided by NIOSH]
• Subjects:
  Accidents, Occupational Occupational Exposure Occupational Health Safety Semiconductors
• Keywords:
  Worker-health; Occupational-hazards; Information-systems; Semiconductors; Accident-statistics; Lost-work-days; Electronics-industry; Occupational-health; Information-processing
• Publisher:
  Lewis Publishers, Inc.
• Document Type:
  Text
• Genre:
  Book
• Place as Subject:
  Michigan ; OSHA Region 5
• CIO:
  National Institute for Occupational Safety and Health (NIOSH)
• Topic:
  Workplace Safety & Health
• Location:
  North America
• Pages in Document:
  25-35
• NIOSHTIC Number:
  nn:00189054
• Citation:
  Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan 1989:25-35
• Federal Fiscal Year:
  1989
• Peer Reviewed:
  False
• Source Full Name:
  Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan
• Collection(s):
  National Institute for Occupational Safety and Health
• Main Document Checksum:
  urn:sha-512:7dc847c09aedf140bc731323e8446b4703641ae07d6ad9e7b7238120dab30b8f7dcaa9b938d34d035f87873a0fe7fec262d5d13dcaf290925445e82b6de3b57d
• Download URL:
  https://stacks.cdc.gov/view/cdc/242827/cdc_242827_DS1.pdf
• File Type:
  [PDF - 168.02 KB ]