Current Perspective on Occupational Safety and Health Issues at the National Institute for Occupational Safety and Health and Control Needs in Semiconductor Manufacture.

Details

• Personal Author:
  Bierbaum, Phillip J.
• Description:
  A brief address was presented concerning the current activities and goals of NIOSH in general and the specific relationship of these activities to semiconductor manufacture. Topics included NIOSH health hazard evaluations, development of a list of the leading work related diseases and injuries, development of prevention strategies to eliminate these conditions, hazards of common and relatively new chemical and physical agents in the semiconductor manufacturing industry, prime examples of areas for primary prevention, and the problem of hazard identification and control in small companies. It was indicated that NIOSH had information on health effects, standard recommendations, and control information for most of the common chemical and physical agents and work conditions found in the industry; control and reduction at the source were cited as preventive measures for the relatively new substance and conditions in this field. Measures for primary prevention were outlined. [Description provided by NIOSH]
• Subjects:
  Chemistry Hazardous Substances Occupational Exposure Occupational Health Safety Semiconductors Staff Development
• Keywords:
  Semiconductors; Occupational-health-programs; Occupational-exposure; Health-hazards; Chemical-processing; Electronics-industry;
• Document Type:
  Text
• Genre:
  Proceedings
• Place as Subject:
  Michigan ; OSHA Region 5
• CIO:
  National Institute for Occupational Safety and Health (NIOSH)
• Topic:
  Workplace Safety & Health
• Location:
  North America
• Pages in Document:
  299-303
• NIOSHTIC Number:
  nn:00188596
• Citation:
  Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan 1989:299-303
• Federal Fiscal Year:
  1989
• Peer Reviewed:
  False
• Source Full Name:
  Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan
• Collection(s):
  National Institute for Occupational Safety and Health
• Main Document Checksum:
  urn:sha-512:7dc847c09aedf140bc731323e8446b4703641ae07d6ad9e7b7238120dab30b8f7dcaa9b938d34d035f87873a0fe7fec262d5d13dcaf290925445e82b6de3b57d
• Download URL:
  https://stacks.cdc.gov/view/cdc/242819/cdc_242819_DS1.pdf
• File Type:
  [PDF - 168.02 KB ]