Methodology for Evaluating Integral Gaussian Profiles

Details

• Personal Author:
  Campbell AB III
• Description:
  This Bureau of Mines report describes a method that utilizes a computer program to evaluate integral Gaussian profiles of atomic concentration versus depth in a solid. The specific use illustrated involves profiling ion-implanted metals using proton-induced x-ray emission (pixe) analysis and ion sputtering (is) for sectioning. Description provided by NIOSH
• Subjects:
  • Occupational Health
  • Radiography
  • Safety
  • Software
• Keywords:
  • ABC10 computer program; Alloys; BASIC programming language; Computer programs; Concentration (Composition); Depth; Ion implantation; Ions; Normal density functions; Sputtering; X ray analysis
• Series:
  Mining Publications
• Subseries:
  Information Circular
• Document Type:
  Text
• Genre:
  Conference Publications ; Pamphlet or Booklet
• Place as Subject:
  Maryland ; OSHA Region 3
• CIO:
  National Institute for Occupational Safety and Health (NIOSH)
• Division:
  AVRC - Avondale Research Center
• Topic:
  Workplace Safety & Health
• Location:
  North America
• Pages in Document:
  1-18
• NIOSHTIC Number:
  nn:10006919
• NTIS Accession Number:
  PB80-158595
• Citation:
  Avondale, MD: U.S. Department of the Interior, Bureau of Mines, IC 8811, 1980 Jan; :1-18
• Federal Fiscal Year:
  1980
• Peer Reviewed:
  False
• Source Full Name:
  Avondale, MD: U.S. Department of the Interior, Bureau of Mines, IC 8811
• Download URL:
  https://stacks.cdc.gov/view/cdc/235932/cdc_235932_DS1.pdf
• File Type:
  [PDF - 743.95 KB]
• Collection(s):
  National Institute for Occupational Safety and Health
• Main Document Checksum:
  urn:sha-512:b5bcbc1e059d1080302c5d8bae7ef84d063e0850da5ebf006d5a5f3138543912637c21a5d22e38c46e65a182d0742764a987c3774214e49f594197a184513691