Mortality Among Semiconductor and Storage Device-Manufacturing Workers
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2005/10/01
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Details
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Personal Author:Beall C ; Bender, Thomas J. ; Cheng H ; Delzell E ; Herrick R ; Kahn A ; Matthews R ; Sathiakumar N ; Schymura MJ ; Stewart J
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Description:Problem: We evaluated mortality during 1965 to 1999 among 126,836 workers at two semiconductor facilities and one storage device facility. Method: We compared employees' cause-specific mortality rates with general population rates and examined mortality patterns by facility, duration of employment, time since first employment, and work activity. Results: Employees had lower-than-expected mortality overall (6579 observed deaths, standardized mortality ratio [SMR] = 65; 95% confidence interval [CI] = 64-67), for all cancers combined (2159 observed, SMR = 78, 95% CI = 75-81) and for other major diseases. Central nervous system cancer was associated with process equipment maintenance at one of the semiconductor facilities (10 observed, SMR = 247, 95% CI = 118-454). Prostate cancer was associated with facilities/laboratories at the storage device facility (18 observed, SMR = 198, (5% CI = 117-313). Conclusions: Further evaluation of workplace exposures or independent investigations of similar occupational groups may clarify the interpretation of associations observed in this study. [Description provided by NIOSH]
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ISSN:1076-2752
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Volume:47
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Issue:10
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NIOSHTIC Number:nn:20054117
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Citation:J Occup Environ Med 2005 Oct; 47(10):996-1014
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Contact Point Address:Dr Colleen Beall, RPHB 523B, 1665 University Boulevard, Birmingham, AL 35294-0022
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Email:cbeall@ms.soph.uab.edu
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Federal Fiscal Year:2006
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Performing Organization:University of North Carolina, Chapel Hill
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Peer Reviewed:True
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Start Date:20050701
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Source Full Name:Journal of Occupational and Environmental Medicine
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End Date:20270630
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Main Document Checksum:urn:sha-512:440935ecd120b68f5d4af896b9b6d17d7bef3dd29ebc4769d1518c3673765428a7613dfb16a29f806238db393ee2aa8f6906c01eaca8b71449c8991d738e66f0
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