Update on Evaluation of Enhanced Darkfield Microscopy and Hyperspectral Mapping for Analysis of Airborne Nanoparticulate Collected on Filter-Based Media

Details

• Personal Author:
  Brenner SA ; Eastlake AC ; Neu-Baker NM
• Description:
  Current best-known methods for engineered nanomaterial (ENM) exposure assessment in occupational environments include the capture of airborne ENMs onto filter media. The current standard method for the analysis of filter media is direct visualization via transmission electron microscopy (TEM) for particle sizing, count, and morphology, often coupled with energy-dispersive x-ray spectroscopy (EDS) for compositional analysis. This method is low-throughput, expensive, and time- and resource-intensive. Enhanced darkfield microscopy (EDFM) with hyperspectral imaging (HSI) and mapping analysis is being evaluated as a high-throughput screening technique to rapidly identify ENMs of interest on filter media samples. We are exploing use of EDFM-HSI for the detection, characterization, and quantitation of ENMs caputred on filters with the intent to develop a standardized method and analytical protocols. Description provided by NIOSH
• Subjects:
  • Air Pollutants, Occupational
  • Engineering
  • Environmental Exposure
  • Manufacturing and Industrial Facilities
  • Microbiology
  • Occupational Health
  • Safety
• Keywords:
  • Nanotechnology
  • Exposure assessment
  • Manufacturing
  • Engineering
  • Environmental exposure
  • Filters
  • Filter materials
  • Airborne particles
  • Electron microscopy
  • Microscopic analysis
  More +
• ISBN:
  9780998878225
• Document Type:
  Text
• Editor:
  Laudon M; Case F; Romanowicz B; Case F
• Genre:
  Proceedings
• Place as Subject:
  New York ; Ohio ; OSHA Region 2 ; OSHA Region 5
• CIO:
  National Institute for Occupational Safety and Health (NIOSH)
• Division:
  EID - Education and Information Division
• Topic:
  Workplace Safety & Health
• Location:
  North America
• Pages in Document:
  274-277
• Volume:
  1
• NIOSHTIC Number:
  nn:20052367
• Citation:
  Advanced Materials -TechConnect Briefs 2018. Laudon M, Case F, Romanowicz B, Case F, eds. Austin, TX: TechConnect, 2018 May; 1:274-277
• Contact Point Address:
  N. M. Neu-Baker, State University of New York (SUNY), Polytechnic Institute, Colleges of Nanoscale Science, Albany; NY, United States
• Email:
  nneu@sunypoly.edu
• Editor(s):
  Laudon M; Case F; Romanowicz B; Case F
• Federal Fiscal Year:
  2018
• NORA Priority Area:
  Manufacturing
• Peer Reviewed:
  False
• Source Full Name:
  Advanced Materials -TechConnect Briefs 2018
• Download URL:
  https://stacks.cdc.gov/view/cdc/211904/cdc_211904_DS1.pdf
• File Type:
  [PDF - 1.77 MB]
• Collection(s):
  National Institute for Occupational Safety and Health
• Main Document Checksum:
  urn:sha-512:fb6e801b361fefb6a3f970b993699195b37ba38758c36e18d3fa6b6a49474340ebbd10d9919ecd11826b0d574a2bd532c37f36da513dc8be35c089dbae69fc54