Evaluation of darkfield microscopy and hyperspectral imaging for analysis of airborne carbon nanotubes captured from occupational settings
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2016/03/28
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Description:Current best-known methods for engineered nanomaterial (ENM) exposure assessment in occupational environments include the capture of airborne ENMs onto filter media. The standard method for the detection of ENMs captured onto filter media is direct visualization via transmission electron microscopy (TEM) for particle sizing, count, and morphology, coupled with compositional analysis, typically by energy-dispersive spectroscopy (EDS). This method is low-throughput, expensive, and time- and resource-intensive. Enhanced darkfield microscopy (EDFM) with hyperspectral imaging (HSI) analysis is being evaluated as a high-throughput screening technique to rapidly identify filter media samples that contain ENMs of interest that may then move on for further, more intensive TEM/EDS analysis. Building upon a preliminary study lead by NIOSH, we are further exploring the use of EDFM/HSI for the rapid visualization and identification of carbon nanotubes (CNTs) captured on mixed cellulose ester (MCE) filter media. We will compare the protocol we develop for EDFM/HSI of CNTs on MCE filter media to conventional TEM methods for accuracy, reliability, and precision of this new screening method. Future directions include expanding the EDFM/HSI protocol to other ENMs and to polycarbonate (PC) filter media samples. [Description provided by NIOSH]
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Pages in Document:77
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NIOSHTIC Number:nn:20047883
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Citation:Quantifying Exposure to Engineered Nanomaterials (QEEN) from Manufactured Products: Addressing Environmental, Health, and Safety Implications, Workshop Proceedings, July 7-8, 2015, Arlington, Virginia. Arlington, VA: National Nanotechnology Coordination Office, 2016 Mar; :77
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Federal Fiscal Year:2016
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Peer Reviewed:False
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Source Full Name:Quantifying Exposure to Engineered Nanomaterials (QEEN) from Manufactured Products Addressing Environmental, Health, and Safety Implications, Workshop Proceedings, July 7-8, 2015, Arlington, Virginia
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Main Document Checksum:urn:sha-512:c7832ca3130a8efb308861cba40c3b535e5b24afa85bf7880116c8de5a78088b3c5b8d45c74e20c339a117f7213737bf3ee4d767c9161345143fdb15b8fe00d2
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