Preliminary survey report, control technology for microelectronics industry at AIRCO Corporation, Phoenix, Arizona.

Details

• Personal Author:
  Smith RK ; Ungers LJ
• Description:
  A walk through survey was conducted at AIRCO Corporation (SIC-3674) in Phoenix, Arizona on November 2, 1981. The survey was conducted as part of a control technology assessment of the semiconductor manufacturing industry. The facility did not produce silicon semiconductor devices, but supplied high purity gas mixtures to semiconductor manufacturers. The survey was conducted to determine if the control technology could be applied to the semiconductor fabrication industry. The facility employed 21 persons. Filling was performed in a two shift operation using nine workers. A medical surveillance program was used. There was minimal safety or evacuation training. No program existed for monitoring ventilation hood flow. All industrial hygiene controls were oriented toward ventilation and enclosures. Each of the toxic gas hoods had a selectable gas flow. Street clothes were worn by employees. Respirators and acid gas entry suits were available. The authors conclude that based on the survey, further evaluation of the facility is not recommended. Neither the process nor the controls used illustrate an exemplary control strategy. Periodic monitoring of air flow across hood faces is recommended, as are dosimetry and area monitoring.
• Subjects:
  Accidents, Occupational Occupational Health Preceptorship Rubber Safety
• Keywords:
  Air-conditioning Air-quality-control Control-technology Dust-exposure Electronics-industry Employee-exposure Field-Study Industrial-hygiene NIOSH-Author NIOSH-Survey Region-9

  More +
• Publisher:
  National Institute for Occupational Safety and Health
• Document Type:
  Text
• Genre:
  Field Studies ; Control Technology
• Place as Subject:
  Arizona ; Ohio ; OSHA Region 5 ; OSHA Region 9
• CIO:
  National Institute for Occupational Safety and Health (NIOSH)
• Division:
  DPSE - Division of Physical Sciences and Engineering
• Topic:
  Workplace Safety & Health
• Location:
  North America
• Pages in Document:
  1-7
• NIOSHTIC Number:
  nn:00135179
• Citation:
  Cincinnati, OH: U.S. Department of Health and Human Services, Public Health Service, Centers for Disease Control, National Institute for Occupational Safety and Health, ECTB 115-32a, 1984 Mar; :1-7
• Federal Fiscal Year:
  1984
• Peer Reviewed:
  False
• NAICS and SIC Codes:
  3674 - Semiconductors and related devices - (SIC)
• Collection(s):
  National Institute for Occupational Safety and Health
• Main Document Checksum:
  urn:sha-512:44210a93f79c208b45c098a38145e6ba588c904962ceba22d9286979d8b686d9680bff73a71c84955379764307969b9154f0027627743f25dbdbfad48e5c539c
• Download URL:
  https://stacks.cdc.gov/view/cdc/179665/cdc_179665_DS1.pdf
• File Type:
  [PDF - 228.29 KB ]