Preliminary control technology survey on Fairchild Semiconductor, South Portland, Maine.

Details

• Personal Author:
  Mihlan GJ ; Mitchell RI ; Willson RD
• Description:
  A preliminary control technology assessment survey was conducted at Fairchild Semiconductor (SIC-3674), South Portland, Maine, on December 4, 1981. The facility manufactured digital bipolar integrated circuits with a staff of 890 production workers and 270 administrators. The facility used a variety of control strategies to control emissions and limit worker exposures to chemical and physical agents. Strategies included engineering controls such as local exhaust ventilation, X-ray and radiofrequency radiation shielding, and process isolation or enclosures; personal protective equipment; and monitoring systems. Local exhaust ventilation of process equipment was used wherever potentially dangerous, toxic, corrosive, or flammable liquid chemicals were used. Shielding was used in ion implantation units to control X-ray emissions, in plasma etching and plasma enhanced chemical vapor deposition operations to control radio frequency emissions, and in substrate exposure to control ultraviolet emissions. Continuous area monitoring of selected chemical agents and radiation film badges were employed. The authors conclude that the facility had an extremely well managed health and safety program that included industrial hygiene, safety, and occupational health.
• Subjects:
  Accidents, Occupational Aluminum Silicates Dust Environmental Monitoring Health Surveys Occupational Health Personal Protective Equipment Plastics Preceptorship Safety Surveys And Questionnaires

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• Keywords:
  Equipment-design Field-Study Industrial-ventilation NIOSH-Author NIOSH-Survey Personal-protective-equipment Radiation-monitoring Radiation-protection Radiation-shielding Region-1 Work-practices

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• Publisher:
  National Institute for Occupational Safety and Health
• Document Type:
  Text
• Genre:
  Field Studies ; Control Technology
• Place as Subject:
  Maine ; Ohio ; OSHA Region 1 ; OSHA Region 5
• CIO:
  National Institute for Occupational Safety and Health (NIOSH)
• Division:
  DPSE - Division of Physical Sciences and Engineering
• Topic:
  Workplace Safety & Health
• Location:
  North America
• Pages in Document:
  1-38
• NIOSHTIC Number:
  nn:00130204
• Citation:
  Cincinnati, OH: U.S. Department of Health and Human Services, Public Health Service, Centers for Disease Control, National Institute for Occupational Safety and Health, ECTB 115-20a, 1983 Jul; :1-38
• Federal Fiscal Year:
  1983
• Peer Reviewed:
  False
• NAICS and SIC Codes:
  3674 - Semiconductors and related devices - (SIC)
• Collection(s):
  National Institute for Occupational Safety and Health
• Main Document Checksum:
  urn:sha-512:e675ef53e415e5fb2f34a8f7428b292a7a559885f0531e71e9c5978bde71f608ea22ce8dc335301e8cfe78272c4893e1cfffe77e85f87af74253451232b23f63
• Download URL:
  https://stacks.cdc.gov/view/cdc/179519/cdc_179519_DS1.pdf
• File Type:
  [PDF - 4.16 MB ]