Welcome to CDC stacks | Analysis for Impurities in Helium Using the Helium Ionization Detector - 10311 | National Institute for Occupational Safety and Health
Stacks Logo
Advanced Search
Select up to three search categories and corresponding keywords using the fields to the right. Refer to the Help section for more detailed instructions.
 
 
Help
Clear All Simple Search
Advanced Search
Analysis for Impurities in Helium Using the Helium Ionization Detector
  • Published Date:
    1/1/1985
Filetype[PDF-2.15 MB]


Details:
  • Personal Authors:
  • Description:
    This Bureau of Mines report describes a chromatographic method for analyzing impurities in helium that utilizes a helium carrier gas contain-ing 25 to 30 ppm Ne. An example of the effect of trace amounts of nitrogen, methane, and moisture on the detector's response is shown. The added neon in the carrier does away with irregularities of the analysis which were experienced when the carrier contained up to 3 ppm Ne. The addition of 25 to 30 ppm Ne causes a loss of sensitivity, but the re-maining sensitivity is adequate for routine analyses. The high-neon carrier allows positive and more linear responses for eight impurities: neon, hydrogen, argon, oxygen, nitrogen, methane, carbon dioxide, and ethane. Neon concentration levels of 0.02 to 125 ppm in helium carrier gases were studied. The high-neon carrier has been in successful rou-tine use in Bureau of Mines helium facilities since October 1981.

  • Supporting Files:
    No Additional Files
No Related Documents.
You May Also Like: