10124152844243MetrologiaMetrologiaMetrologia0026-13941681-757526361398456232210.1088/0026-1394/50/6/663HHSPA714214ArticleParticle size distributions by transmission electron microscopy: an interlaboratory comparison case studyRiceStephen B1ChanChristopher2BrownScott C2EschbachPeter3HanLi4EnsorDavid S4StefaniakAleksandr B5BonevichJohn6VladárAndrás E6Hight WalkerAngela R6ZhengJiwen7StarnesCatherine8StrombergArnold8YeJia9GrulkeEric A9 Lawrence Murphy, Cabot Corporation, 157 Concord Road, Billerica, MA 01821, USA Dupont Central Research and Development, Experimental Station—Bldg 228, PO Box 80228, Wilmington, DE 19880-0228, USA Hewlett Packard Corporation, OR, USA RTI International, Aerosol Science, Nanotechnology Engineering Technology Unit, 3040 Cornwallis Rd, PO Box 12194, Research Triangle Park, NC 27709, USA National Institute for Occupational Safety and Health, 095 Willowdale Road, Morgantown, WV 26505, USA National Institute of Standards and Technology, 100 Bureau Drive, Stop 8443, Gaithersburg, MD 20899-8443, USA US Food and Drug Administration, Division of Chemistry and Materials Science (DCMS), WO62, Room G102, 10903 New Hampshire Avenue, Silver Spring, MD 20993, USA Statistics Department and Applied Statistics Laboratory, University of Kentucky, Lexington, KY 40506, USA Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USAeric.grulke@uky.edu22820151120130892015506663678

This paper reports an interlaboratory comparison that evaluated a protocol for measuring and analysing the particle size distribution of discrete, metallic, spheroidal nanoparticles using transmission electron microscopy (TEM). The study was focused on automated image capture and automated particle analysis. NIST RM8012 gold nanoparticles (30 nm nominal diameter) were measured for area-equivalent diameter distributions by eight laboratories. Statistical analysis was used to (1) assess the data quality without using size distribution reference models, (2) determine reference model parameters for different size distribution reference models and non-linear regression fitting methods and (3) assess the measurement uncertainty of a size distribution parameter by using its coefficient of variation. The interlaboratory area-equivalent diameter mean, 27.6 nm ± 2.4 nm (computed based on a normal distribution), was quite similar to the area-equivalent diameter, 27.6 nm, assigned to NIST RM8012. The lognormal reference model was the preferred choice for these particle size distributions as, for all laboratories, its parameters had lower relative standard errors (RSEs) than the other size distribution reference models tested (normal, Weibull and Rosin–Rammler–Bennett). The RSEs for the fitted standard deviations were two orders of magnitude higher than those for the fitted means, suggesting that most of the parameter estimate errors were associated with estimating the breadth of the distributions. The coefficients of variation for the interlaboratory statistics also confirmed the lognormal reference model as the preferred choice. From quasi-linear plots, the typical range for good fits between the model and cumulative number-based distributions was 1.9 fitted standard deviations less than the mean to 2.3 fitted standard deviations above the mean. Automated image capture, automated particle analysis and statistical evaluation of the data and fitting coefficients provide a framework for assessing nanoparticle size distributions using TEM for image acquisition.

1. Introduction1.1. Nanoparticle size distributions by transmission electron microscopy

Nanotechnology research is accelerating innovation. For example, the number of nanoparticle patents has an exponential growth rate of >30% in recent years. Nano-objects are materials with one, two or three external dimensions on the nanoscale, nominally ranging from 1 nm to 100 nm [1]. Nanoparticles, which have all three external dimensions on the nanoscale, have performance properties that often depend on their physico-chemical characteristics, i.e. size, shape, surface structure and texture. For example, catalytic properties of nanoparticles usually depend on their crystal structures, size distributions and exposed surfaces, edges and corners. The growth rates of different crystallographic surfaces can vary, leading to asymmetric particles [2]. Toxicity can be affected by nanoparticle size [3], which makes this an important metric for risk assessment [4, 5]. Stakeholders in nanoparticle characterization include industry, academics, government agencies (and particularly, regulatory agencies), and the general public through non-governmental organizations.

There are a wide variety of analytical methods for particle size measurements, including electron microscopy, dynamic light scattering [6], centrifugal liquid sedimentation, small-angle x-ray scattering, field flow fractionation, particle tracking analysis, atomic force microscopy [7] and x-ray diffraction [8]. These methods are based on different measurands, and a comparison between methods should be made with care. Many of the measurement methods for particle sizes on the nanoscale have focused on assessing an average particle size for the sample. Performance properties of nanoparticles often depend on size and shape and few particle size distributions of commercial products are monomodal and narrow in range. In fact, the nanoparticle size distribution is important to product performance in applications, in the environment, and for health and safety and for regulations. Transmission electron microscopy (TEM) methods provide two-dimensional images of nanoparticles; these images can be used to produce number-based size distributions.

1.2. Analysis and reporting of size distributions

Because we are interested in more than a single point representation of the sample size, we compared appropriate reference distributions, such as the normal, lognormal and Weibull distributions, with particle size distribution data. TEM particle size data were converted directly to cumulative number-based distributions. This information is useful for both nanoparticle applications, for which the surface properties may be distinctly different below a specific length scale, and regulatory requirements, for which the fraction of particles below a length scale of 100 nm would be related to whether the sample is on the nanoscale. Size distribution reference models generally have two parameters, representing the size and the shape of the distribution. For the normal distribution, these would be the sample mean and the sample standard deviation. The number of particles needed for high-accuracy estimates of the average diameter is known to depend on the spread of the particle size distribution [9].

An important step in the process is visualizing the fitted model prediction relative to the actual data. This step helped us answer the following question: where does the model deviate from the data, i.e. over what diameter range do we know the distribution well? This has relevance for the application and regulatory communities. Because TEM can be a costly method, automated image capture, particle analysis and statistical assessment were preferred.

1.3. Metrology checklist and term definitions

A metrology checklist [10], established by ISO/TC 229, was used to assess and design the protocol (appendix A). There are a variety of reference materials for characterizing nanoparticle size (see [11] for lists of reference materials [12] and their sources). RM8012, a suspension of discrete, spheroidal, gold nanoparticles with a nominal size of 30 nm (NIST), was used in this study to facilitate sample preparation, image capture, particle analysis and statistical assessment of measurement uncertainty. Appendix B provides definitions of statistical, measurands and metrology terms used in this study.

1.4. Protocol objectives

This case study is intended to provide a scientific foundation for an International Organization for Standardization (ISO; www.iso.org) standard for the measurement of particle size distributions on the nanoscale by TEM. The committee, ISO/TC 229 Nanotechnologies, was established in 2005, and now has 34 national member bodies, about 40 liaison members (other ISO TCs or international organizations), along with 11 observers. The authors of this study are members of the US Technical Advisory Group (TAG) to TC 229. Standards developed by ISO/TC 229 are intended to improve commerce and facilitate communications among buyers, sellers and regulators of raw and intermediate materials.

The case study protocol for 30 nm gold nanoparticles was based on a National Institute for Occupational Safety and Health (NIOSH) internal interlaboratory comparison [13, 14] and a generic protocol from the UK National Physical Laboratory [15]. Discrete, spheroidal nanoparticles represent one of the less-complex nanoparticle morphologies; measurands of this sample should have relatively high reproducibility, and fitted parameters modelling the distributions should have low relative standard errors (RSEs). There are many TEM instruments, and sample preparation techniques are often tuned by each operator for their system. Typically, TEM sample preparation is a major contributor to measurement uncertainty. Sample preparation was not assessed in this case study. Sample mounting and dilution guidance from previous studies of this reference material was used by one lab to prepare all samples. The major constraint on TEM instrument factors was the requirement for setting the required image resolution to >2 pixels nm−1. This gave an image resolution contribution to the measurement uncertainty for a 30 nm particle of ~1.6% (<0.5 nm/30 nm). The foci for this protocol were automation of image capture and particle analysis and its control plus statistical assessment of the data, the quality of the parameters for the reference models and the reproducibility of the interlaboratory results.

ISO standards exist for the measurement of particle size distributions of powders (ISO TC/24), including representation of particle size analyses [1620], accuracy of measurement methods [21] and image analysis methods [22]. These methods, particularly ISO 9276-3 [17], have been applied to results of this interlaboratory comparison. The interlaboratory comparison team included industry (Cabot Corporation, DuPont, Hewlett Packard and RTI), US government agencies (NIOSH, Food and Drug Administration (FDA), NIST) and a university (University of Kentucky). For purposes of confidentiality, the labs are referred to as Labs A to H. The University of Kentucky prepared all samples.

2. Materials and methods2.1. Sample selection

NIST RM8012 has 30 nm nominal diameter gold nanoparticles stabilized by citric acid in a water dispersion. The NIST Report of Investigation [23] provides a mean particle diameter (area-equivalent diameter) of 27.6 nm. No standard deviation of the distribution was reported. Rather, a conditional measurement uncertainty was computed for results using different ampoules of the reference material (described in appendix B). The differential particle size histogram (figure 6 of [24]) shows a size range from 15 nm to 50 nm, although these numbers were not certified. This size range was used for plotting the distributions of this study. Figure 1 shows scanning electron microscopy (SEM) and TEM images for these nanoparticles. The spheroidal particles exist as discrete entities in water solution, but are faceted with specific crystal faces. These nanoparticles are not completely spherical and, depending on how they ‘sit’ on the substrate, appear to be more or less spherical, triangular or hexagonal.

2.2. Sample preparation

Two sample preparation objectives are as follows: disperse the nanoparticles over the 3 mm TEM sample grid so that particles do not touch (so the edges of the particles will be clearly visible in the imaging system) and uniformly distribute the nanoparticles across the sampling medium [22]. RM8012 gold nanoparticle colloidal dispersion is stable; the nanoparticles have a negative charge. Prior protocols attached this standard reference material to amine-functionalized silicon grids (Catalog # SG01-051A, Dune Sciences). The positive charge on the functionalized surface helps immobilize the negatively charged gold nanoparticles, and the silicon substrate provides a relatively uniform background for improved nanoparticle imaging [13, 14, 24]. Wafers and a RM8012 sample were generously provided by NIOSH.

The typical time required to receive the sample, acquire over 500 data points, analyse the data with ImageJ and assemble the frame-wise data into a master table for analysis exceeded 20 h. Each lab received one grid; no grids were shared between laboratories.

2.3. Instrument factors

ISO 13322-1:2004 [22] provides guidance on electron microscope operating conditions for particle size imaging and a measurement uncertainty analysis specifically for lognormal distributions, which would be the most common reference model for nanoparticle distributions. Table 1 shows the instrument factors of each lab. Specific guidance was as follows [22]:

set the accelerating voltage according to the material to be measured (120 kV);

select the sample working distance specified by the electron microscope manufacturer for high-resolution imaging;

mount the sample flat on the specimen holder with the stage tilt set to zero;

switch off the dynamic focus and tilt correction;

align the instrument according to the manufacturer’s procedures;

select operating conditions to minimize drift.

While no SEM instruments were used in this study for particle size determination, it is notable that a recent good practice guide [15] provides some guidance on selection of instrument parameters for use with this type of instrument for particle sizing.

Calibration

Since TEMs have wide ranges of magnification and many operating modes, the actual magnification at any given instrument settings may differ from the indicated magnification by up to 10%. Calibration of the instrument to a known length scale under optical conditions similar to those used for analysis is preferred. Standards should be run near the time of the study to provide verification of correct instrument operation within manufacturer specifications and to validate measurement procedures. Typical examples are given in a good practice guide ([15, chapter 4]).

2.4. Image acquisition

Each participating lab used the loading procedure specific for their instrument to mount the TEM grid in the system. The loading procedure was to minimize the eucentric height adjustment required. The images were to be of sufficient quality such that individual particles can be resolved and their dimensions measured. Each lab analysed one wafer, measured at least 500 particles, and reported the results to the team. The specific instructions were the following.

Acquire images that have histograms centred and wide enough to cover at least 80% of the possible grey levels.

Select a magnification/image resolution combination that will provide a minimum of two pixels/nm, i.e. >2 pixel nm−1 or <0.5 nm/pixel.

Ensure that a scale bar is visible in each digital image/frame.

Do not exclude irregularly shaped particles or particles with sharp corners.

Do not report data for any touching particles (note: overlapping particles can rest on one another, reducing their projected 2D area in a top-down view).

Do not report data for any particles that appear cut by the frame (note: for the case in which there is a difference in particle diameters greater than an order of magnitude, it may be necessary to establish a frame, divide it via a grid pattern, and measure large particles at a lower magnification. The protocol did not address this issue).

Count and report at least 500 particles in frames that are well spaced across the sample (note: the number of particles measured directly affects the measurement uncertainty of the sample mean and standard deviation. In general, the user will select precisions for the sample mean and standard deviation, and then estimate how many particles might be needed. There is guidance on how the sample mean is affected by the sample size [9, 2528], but less guidance on the effects of sample size on the sample standard deviation).

For all selected particles in each frame, report the particle number, the frame number and all measurand data.

Save images as lossless (like tagged image file format, tiff or dmc) image file type. Do not save images as lossy image file type, like jpg.

The area-equivalent average diameters of all reported particles were used to generate number-based, cumulative particle size distributions.

2.5. Particle analysis

Since a large number of nanoparticles are needed for a high-quality particle size distribution, the work will be facilitated when image analysis software is used. Both commercial and open source software are available. For a typical sample, an appropriate reference model for the data may not be known, the data may not be monomodal, and the sample may be contaminated with nanoparticles of different sizes and shapes. Multiple models might need to be compared with the data and multiple measurands might be needed to help screen for the desired nanoparticles. Therefore, we have used a more general analysis approach that estimates the sample mean and standard deviation from a non-linear fit of the reference model to sample population data. The minimum number of particles for analysis was set at 500 for each lab, based on the experience from prior studies.

This protocol assumed that all images were taken in digital format. ImageJ, open source software with a suite of analysis routines (http://rsbweb.nih.gov/ij/download.html), was used by all laboratories for particle analysis. The procedure steps were as follows.

Create working copies of all images/frames (preserve the original unmodified images).

Open ImageJ and open the frame file.

Set the measurement scale using the scale bar or another measurement of pixel size, returning to the original scale prior to continuing.

Crop the image to remove scale bars and other image artefacts that might affect contrast or particle analysis.

Check and correct brightness and contrast to ensure that all images have histograms centred and wide enough to cover at least 80% of the possible grey levels.

The thresholding operation may result in frame files with single pixel artefacts or poor image quality, e.g. rough particles or uneven background due to non-uniform electron beam illumination. In the case of the former, apply the despeckle and erode/dilate processes to remove these artefacts and save the changes. In the case of poor image quality, the operator could clean up the edges of particles or correct for uneven background by applying special filters. Assess the image transformation and save changes.

Touching particles should not be addressed by using automated separation algorithms (Watershed, in the case of ImageJ). Rather, all particle analyses should be recorded, and touching particles should be removed manually from the spreadsheet of the results.

Select the measurands (such as area, shape descriptors, Feret’s diameter). Note: several size and shape descriptors will help identify imaging and measurement issues as well as assist with the characterization of the sample.

Analyse the particles (ImageJ specific settings should include the following: show outlines, display results, include holes and exclude on edges).

Save each image file that shows particle outlines and their number sequence (filename.tif) and the spreadsheet (Results.xls), which reports all measurand values, the particle number and the frame number associated with each particle.

2.6. Data analysis

There are three major applications for statistical analysis of particle size data: assessment of data robustness, fitting reference models to the size distributions and assessment of measurement uncertainty.

2.6.1. Statistical assessment of data

Analysis of variance (ANOVA) was used to assess the intra-laboratory repeatability (variation with one operator and one instrument; section 2.20 of [29]) and interlaboratory reproducibility (variation of measurements with the same process done with different instruments and different operators; section 2.24 of [29]). At the specified resolution (>2 pixels nm−1), there were usually a small number of nanoparticles in any given view frame for most labs. It is not likely that reasonable estimates for the sample size mean and standard deviation can be obtained from one frame. Therefore, one-way ANOVA was used to test the null hypothesis (see the definition in appendix B) that all of the frames within one lab had the same mean area-equivalent diameter (repeatability). Also, ANOVA with the frames treated as a random effect nested within labs was used to investigate the null hypothesis that the mean area-equivalent diameter among laboratories was the same (reproducibility). Finally, since RM8012 was investigated for its mean area-equivalent diameter, the bias (or trueness; appendix B and sections 2.14, 2.14 of [29]) of the reported area-equivalent diameters can be estimated.

For intra-laboratory repeatability, the objective, metric and software were as follows.

Objective: assess whether all frames within a selected lab are best represented by the same mean.

Null hypothesis: for each lab, all frames have the same mean.

Alternative hypothesis: for each lab, not all frames have the same mean.

Metric: if the p-value <0.05, then we reject the null hypothesis and conclude that at least two frames reported by that lab have different averages.

Software: SAS v9.3, the GLM procedure (http://support.sas.com/documentation/cdl/en/statug/62962/HTML/default/viewer.htm#glm_toc.htm). A program is available for interlaboratory comparison users to perform this test on data matrices imported from an Excel spreadsheet.

For interlaboratory reproducibility, the objective, metric and software were as follows.

Objective: assess whether all labs are best represented by the same mean.

Null hypothesis: all labs have the same mean.

Alternative hypothesis: not all labs have the same mean.

Metric: if the p-value <0.05, then we reject the null hypothesis and conclude that at least two labs have different averages.

Software: SAS v9.3, the MIXED procedure (http://support.sas.com/documentation/cdl/en/statug/63962/HTML/default/viewer.htm#mixed_toc.htm).

2.6.2. Fitting reference models to data

Three reference models are commonly fitted to cumulative particle size distribution data: lognormal, Rosin–Rammler–Bennett and Weibull. These three, plus the normal distribution, were compared with the cumulative frequency data generated in this case study. In all cases, two parameter models were used. Differential probability distributions were not used as information is lost when the data are binned, often obscuring the details near the ends of the distributions.

Three different visualization methods [17] were used to optimize the parameter estimates for cumulative distribution data: (1) minimizing the variance between the data and reference model, (2) setting the residual deviations between the data and reference model to zero and (3) transforming the three reference models into linear functions (quasi-linear regression). A commercial non-linear regression package, SYSTAT® software (version 10.1), was used to optimize parameters for each data set.

The software provided the R2 value for the optimized fit, the parameter estimates (for example, the mean, (fit), and standard variation, s(fit)), and the standard errors of the parameter estimates (for example, SE(fit) and SEs(fit)). The mean and the standard deviation of the model are descriptive statistics. The standard error of a descriptive statistics describes the expected bounds for a random sampling process; it describes how close the sample statistic (the mean or standard deviation) is to those of the population. The standard errors were determined using Wald confidence intervals, which are appropriate when there is little correlation between the fitted parameters, i.e. the mean and the standard deviation (this is the case for all of our data). The ratio of the standard error to the estimate is the RSE. The RSE decreases as the number of particles increases; smaller RSE values indicate that the estimate of the parameter for the sample is closer to that of the whole population. The RSE can be used as a measure of quality for fitted parameters, facilitating the comparisons of different reference models, different measurands and different fitting methods.

For each parameter and its associated statistics, it is possible to construct a ‘grand’ statistic for the interlaboratory study. For example, the fitted lognormal means that each lab will have a grand mean and a grand standard deviation. The ratio of the grand standard deviation to the grand mean is the coefficient of variation for that parameter or statistic (for example, ĉv,x̄(fit) and ĉv,s̄(fit)). The coefficient of variation, a parameter’s standard error divided by its estimate, is also a type A component of the measurement uncertainty (section 2.26 of [29]) and related to the reproducibility of the data. The definitions for these statistical tools are given in appendix B.

2.6.3. Assessment of measurement uncertainty

Standards organizations require statements on measurement uncertainty. There are differences between CEN (Comité Européen de Normalisation), ISO and ASTM (American Society for Testing and Materials) approaches [30], although all of these report pooled uncertainties. ASTM uses precision and bias estimates (ASTM E456), which generally qualifies the test method. ISO Guide to the Expression of Uncertainty in Measurement (GUM) [31] describes top-down and bottom-up approaches. The top-down approach, based on repeated testing and the statistical evaluation of the results, is used often in chemistry (see ISO 5725). The bottom-up approach is more often (but not only) used in physics. This approach identifies all relevant measurement parameters, identifies all sources of uncertainties in the test, quantifies each source of uncertainty with a probability distribution, calculates the combined (pooled) standard uncertainty, and estimates the expanded uncertainty at the 95% confidence interval. Some references provide great detail on measurement uncertainty for measurement of particle size alone [9, 2528]. We have followed the more general approach of Braun et al [6].

Measurement uncertainty

For the area-equivalent diameter, elements of the pooled measurement uncertainty, (uc(x)), could include the interlaboratory reproducibility, (u(ir)); the trueness, (u(t)); and the image resolution error, (u(c)). The image resolution error depends on particle size, ranging from 3.3% to 1.7% to 1% for particle sizes of 15 nm, 30 nm and 50 nm.

uc(x)=u(ir)2+u(t)2+u(c)2.

For the normal distributions, we have the information needed to compute each of these components for the sample mean. However, the lognormal mean of RM8012 has not been reported or certified, so only the interlaboratory reproducibility and the image resolution error can be computed.

3. Results and discussion3.1. Sample preparation and instrument factors

Although each laboratory used a different TEM instrument, the sample grids were suitable for each one. Sample preparation, a known element of variability for TEM analysis, was not varied in this study. RM8012 is known to have discrete, non-aggregated gold nanoparticles in its suspension medium. This is confirmed by its Report of Investigation, in which the average particle size by dynamic light scattering is essentially the same as the size by TEM. In general, the gold nanoparticles were well separated on the functionalized silicon TEM grid surfaces, but a number of touching particles were observed on all grids. There are at least two mechanisms by which this could occur: agglomeration, which is a general phenomenon for colloidal particles in solution and increases with particle concentrations, and random deposition of one nanoparticle near another. Touching nanoparticles were assumed to be agglomerated. For Laboratory H, a total of 672 nanoparticles were imaged. Of these, there were 530 discrete nanoparticles. Fifty-one dimer, 11 trimer and one septamer nano-objects were judged to be touching and were not counted, i.e. only 79% of the imaged nanoparticles could be used directly for the automated particle analysis. It is likely that the identification of touching particles could be automated by using shape factor or aspect ratio measurands, but this was not addressed in this interlaboratory comparison.

One lab reported a calibration error, which occurred when two different magnifications were used for particle imaging (one of these magnifications had not been properly calibrated). This type of error was easily detected by the ANOVA analysis of frame-to-frame particle diameter means. In general, the labs could achieve good contrast between nanoparticles and the background, and the sample preparation method [13] gave a reasonable number of discrete, non-touching particles on the grids.

3.2. Automated particle analysis via ImageJ

One laboratory reported thresholding problems that resulted in a number of small particle artefacts being reported. This was detected by reviewing the cumulative particle size distribution of all the data; about 5% of the ‘particles’ were less than 6 nm, which was known not to be characteristic of this reference material. The issue was corrected by redoing the thresholding and ensuring that the despeckle and erode/dilate steps were used. The effects of the erode/dilate step can be checked directly during the particle analysis process. The artefacts also could be removed manually, but this would reduce the benefits of automated analyses.

Touching particles were not analysed in this interlaboratory comparison, although ImageJ has a tool to do so (Watershed). The Watershed tool separates touching particles by inserting a linear boundary at the ‘necks’ between particles. This approach tends to reduce the total area attributed to each particle and to lower the average area-equivalent diameter reported for the sample. Figure 2 shows residual deviations and quantile plots for the analysis of non-touching and touching particles reported by Lab E (the maximum Feret diameter was used as the measurand for these plots). The Watershed algorithm data have larger residual deviations than the non-touching particle data (figure 2(a)). On a quantile plot, the size distribution for the Watershed algorithm data is narrower and the mean value of the distribution is shifted to a lower value (figure 2(b)). The use of this algorithm could introduce a consistent bias into the sample mean data.

Other factors affecting particle analysis. Even with discrete, spheroidal particles and a good sample preparation method, the results of the automated particle size analysis can require additional operator review. Typical analysis problems were thresholding inconsistency and artefacts created by the inclusion of scale bars in the analysed images. Since gold nanoparticles are faceted, crystalline solids, different cross-sectional shapes can be present in the images and very few particles have shape factors near one (representing a circular cross-section). Although area-equivalent diameter was the preferred measurand for this study (particularly since this was the measurand investigated for RM8012), other measurands that relate to nanoparticle shape provide important information about the sample. These include the minimum and maximum Feret diameters, and the shape factor. For more complex shapes, additional measurands should be considered [20].

The protocol used for the US TAG interlaboratory comparison on gold nanoparticles provided no guidance for post-processing review of the raw data from the automated image capture and particle analysis process. Interlaboratory comparisons of the data showed that there were differences in the ranges of particle sizes reported as well as the cumulative particle size distributions. These differences appeared to be due to differences in how operators treated the data and/or set thresholding parameters.

3.3. Data analysis3.3.1. Assessment of data quality

Statistical methods used to assess data precision and accuracy assume homogeneous variance and normally distributed residuals.

Intra-laboratory assessments

The one-way ANOVA test provides a rapid way to assess whether the data in all frames within a lab are best represented by the same mean. If the null hypothesis is not rejected, we have more confidence in the data. If the null hypothesis is rejected, the particle data (images plus measurand results) can be reviewed to determine whether any artefacts or unusual particles exist in any frame with a mean not equal to the lab grand mean. Therefore, intra-laboratory statistical assessment can help identify the following: (1) repeatability, (2) particles that may be outside the expected range for the distribution, (3) frames with dissimilar mean particle sizes, (4) calibration errors at different magnification levels, (5) thresholding to eliminate small ‘ghost’ particles, (6) thresholding to eliminate large particles, (7) touching particles measured as one particle, and others.

Any particles added to or removed from the data set would need to be justified on technical grounds. We prefer not to use traditional outlier tests to identify particles that appear to be outside the distribution—we are trying to determine its true ‘breadth’. In addition, showing the data range and mean for each frame can trigger reviews even when the frame mean may be similar (an unusually large and an unusually small particle might offset each other, for example). The variation in the sample means provides an indication of the intra-laboratory repeatability.

Figure 3 shows the data range and mean for each frame reported by Lab G. The grey boxes show the interquartile range for each frame (the middle 50% of the cumulative distribution), with solid diamonds indicating the frame mean. The vertical line represents the overall sample mean. Two of the frames have interquartile ranges less than the overall sample mean (frames 1 and 14). Frames 1, 5, 14 and 19 are the frames that are trimmed by our ‘>90th percentile or <10th percentile’ rule. Extreme data points of these frames were reviewed to ensure that the image represented a nanoparticle and was not an artefact. All verified nanoparticles were used to generate the cumulative distribution for each lab.

Different measurands will have different p-values in the ANOVA test. As mentioned before, it can be useful to evaluate several measurands as a way to better describe the morphology of a sample. As these gold nanoparticles are faceted, they will differ from perfect spheres, so different length measurements, such as the maximum Feret diameter and the shape factor, would provide additional information about their size and shape. Table 2 shows the one-way ANOVA analysis for three different measurands: the area-equivalent diameter, the maximum Feret diameter and the shape factor. We have taken the logarithm of each measurand because the distribution of the non-transformed data is right skewed. For each measurand, there are some labs that do not meet the null hypothesis; the mean of the measurand for at least one frame is not similar to the mean of the entire sample. Only two labs of the eight, A and D, meet the null hypothesis for all three measurands.

Interlaboratory assessments

Table 3 shows the mean and standard deviation (as defined for normal distributions, appendix B), the minimum, and the maximum area-equivalent diameters for each lab. Assuming that our laboratory results are normally distributed, we can compute the mean, standard deviation and coefficient of variation for each of these parameters, i.e. the grand statistics for each of these parameters across laboratories. The grand coefficient of variation for each parameter should relate to its relative measurement uncertainty. This approach does not differentiate between homogeneity (sample-to-sample) and reproducibility (lab-to-lab) causes.

RM8012 has been certified for its mean value only ( = 27.6 nm). The sample means for each lab can be compared directly with this value. The grand mean, grand mean, of the eight individual labs is quite similar to the reference value; its standard deviation is 0.71, and its relative coefficient of variation is 2.6% (expressed as a percentage). As the standard deviation and data range of RM8012 have not been reported, the interlab grand means for these parameters cannot be compared with those of the reference material.

The grand standard deviation, sgrand mean, of the area-equivalent diameters is 2.44 nm and its relative coefficient of variation is 15%. The low and high area-equivalent diameters for the interlaboratory comparison labs have higher relative coefficients of variation, 15.9% and 28.2%, respectively. In general, parameters linked to the breadth of the distribution have much higher coefficients of variation than does the distribution mean. Since the mean diameter is reported for RM8012, we can compute the bias using the definition provided in appendix B. For m = (the mean of the sample or reference material), the bias is defined as

bias=Σi=1nΔm,in

where Δm = |cmccrm| is the absolute difference between the mean measured value and the certified value.

Table 4 shows the Δm values for each lab. The relative bias for the mean of the interlaboratory comparison study was 2%.

The interlaboratory assessment used a model with frames nested within labs to identify differences between pairwise laboratories. Similarly to the intra-laboratory assessment, the null hypothesis is that every lab has the same mean. Results from the ANOVA test can vary depending on the measurand. For the area-equivalent diameter measurand, the frame-to-frame (nested) ANOVA analyses gave similar results when using either the area-equivalent diameter (corresponding to the normal distribution) or the log transformed measurand (corresponding to the lognormal distribution). For most lab pairs, the null hypothesis was rejected; only 4 of 28 pairs fail to reject the null hypothesis. For this comparison, frames with means less than the 10th percentile or greater than the 90th percentile were excluded, i.e. data that might be questionable were not considered. This suggests that the lab means are, in general, different from each other, possibly related to the use of different instruments and different operators.

3.3.2. Fitting reference models to data

The visual comparison of the data to a reference model is valuable in selecting which models are appropriate. Figure 4 shows a cumulative distribution plot of the Rosin–Rammler–Bennett model applied to the shape factor data of lab H. The equation is shown in the figure; the fitting parameters were selected to minimize the variance between the model and the data. In general, the model (red curve) tracks directly through the data except at high values. There are more nanoparticles with high shape factors than predicted by the model; in this data set, the highest shape factor was ~1.7 and a significant fraction of the nanoparticles had shape factors greater than 1.2. The median value for the shape factor is 1.07, indicating that the gold nanoparticles are not perfectly spherical.

Selecting the reference model (measurand = area−equivalent diameter). The lognormal distribution is the preferred choice for the particle size distribution data in this interlaboratory comparison as its fitted parameters have lower coefficients of variation than other reference models. Table 5 reports the parameter estimates, their standard errors, and the RSEs for the normal and lognormal reference models applied to the data of each lab. The quality of the fit can be assessed, in part, by comparing the RSE for the parameter estimates of the two reference models. The RSE grand mean for the lognormal model is one-fourth that of the RSE grand mean for the normal model. The RSE grand standard deviation for the lognormal model is about 30% smaller than that of the normal model. The R2 values for both reference models are close to one and provide little differentiation. The Weibull distribution was also fitted to these data. It had lower R2 values, higher RSE values, and a poor fit visually to the cumulative distributions, particularly at the lower particle sizes.

The standard error of a statistic is expected to decrease as the number of data points increases (SE ~ 1/√n). As shown in figure 5, the RSEs of the fitted lognormal mean and standard deviation show an inverse trend to the number of particles measured. The R2 values of power law correlations for these data RSEs are not high, likely reflecting other factors associated with the different laboratories.

The coefficient of variation represents the standard deviation of a statistic, and can be used to compare reference model choices across the interlaboratory study (using the ‘grand mean’ approach). For normal and lognormal distributions, the mean and standard deviation can be computed both from the standard definitions and the non-linear regression approach (fitted parameters). Table 6 shows these data for these four cases (two reference models with two estimation methods). The two coefficients of variation for the fitted parameters (mean and standard deviation) need to be considered together in making the decision for a reference model. For the fitted parameters, the coefficient of variation for the lognormal mean is much smaller than the coefficient of variation for the normal mean, while the coefficients of variation for the related standard deviations are similar. Therefore, the lognormal reference model appears to be the better choice when non-linear regression is used. When the standard definitions for mean and standard deviation are used, the coefficients of variation for the respective grand means are similar while the coefficient of variation for the standard deviation of the lognormal reference model is lower than that for the normal reference model. In this case, the shape of the distribution appears to be better described by the lognormal model.

Selecting measurands

In this study, the preferred measurand is the area-equivalent diameter, primarily because the sample itself has been well studied with respect to Da–e. With more complex morphologies, the choice of key measurands may not always be guided by the application. For example, nanoparticle shape might be characterized either by the shape factor or circularity; the choice might be made based on the data quality. Or, different image processing algorithms might give data of different quality. As discussed in the previous section, ANOVA tests can be used to identify frame-to-frame similarities of measurand means. This distribution-independent approach provides some guidance on which measurands are well known.

A comparison of coefficient of variation values for the area-equivalent and maximum Feret diameters showed no statistically significant difference between these measurands. The R2 values for the non-linear regression fits were both 0.998. The coefficients of variation for the means and standard deviations of these measurands were similar, and both values were within one standard deviation of each other. Therefore, the selection of either would provide a similar measurement uncertainty for the distribution fit.

Selecting the fitting method

Three fitting methods are described in ISO 9276-3 [17]. Figure 6 compares fitted data for two labs that did not reject the null hypothesis for similar frame-to-frame means (Labs B and F, table 5). The comparison included the ANOVA frame-to-frame assessment (boxplot), a cumulative frequency plot, a residual deviation plot and a quasi-linear regression (quantile) plot. For Lab B, the ANOVA boxplot (A1) shows relatively uniform distribution of data around the mean diameter (computed using the standard definition; solid vertical line). The cumulative distribution plot (a2) shows that the model (solid curve) tracks the data well up to 90% of the sample, then underestimates the fraction of large particles. The residual deviation plot (a3) shows systematic deviations of the data from the model. The analysis of this effect is beyond the scope of this work. The quantile plot (a4) shows that the model tracks the data reasonably well between −2 and +2 standard deviations from the mean (as shown on the Y -axis). Above and below these levels, there are systematic deviations.

Lab F had the lowest coefficients of variation for its parameters. The boxplot for Lab F (b1) shows a relatively uniform distribution of the data around the mean diameter. On the cumulative distribution (b2), the model (solid curve) tracks the data well over the entire distribution. The residual derivation plot (b3) shows that there are systematic deviations from the model and the data. The quantile plot (b4) shows that the model tracks the data well over the range from −2 to +2 standard deviations from the mean. However, there are noticeable deviations of the data for larger nanoparticles for standard deviations greater than 2.

Based on these examples, the cumulative distribution plot appears to be a reasonable method to develop a general fit to the data. The residual deviation plot would be most sensitive to differences in the middle of the distribution. The quantile plot is very efficient for identifying deviations at the edges of the distribution. In general, the choice of method will depend on the application for the data and model.

3.3.3. Assessment of measurement uncertainty

When we evaluate the area-equivalent diameter using the normal model, we can generate the following measurement uncertainty components for the sample mean: the interlab reproducibility, the trueness and the image resolution. However, since the reference material was not certified for a lognormal reference model, it is not possible to determine the trueness of the preferred reference model parameters of this study. Rather, we computed expanded measurement uncertainties for the reference model parameters, mean and standard deviation of the interlaboratory comparison. Using coefficients of variation allowed the comparison of lognormal and normal parameters on a relative basis. The equation used was [23]

UILC=kcv1+1N

where k = 2, N = 8 (number of observations), and cv corresponds to the appropriate value in table 6. The most interesting comparison is between the fitted parameters of the lognormal distribution (the preferred model) and the standard definition parameters of the normal distribution (RM 8012 is certified for this mean). For the fitted lognormal distribution, UILC,x(fit) = 1.62% and UILC,s(fit) = 12.6%. For the normal distribution, UILC, = 5.54% and UILC,s = 33.7%. Even though the mean area-equivalent diameter for this interlaboratory study was similar to the value assigned to RM8012 (table 3), the expanded measurement uncertainty was over 5% on a relative basis.

4. Summary and conclusions

Automated analysis of particle size measurands is an important objective for interpreting particle size distributions by TEM. Properly implemented, automated image analysis should reduce the time needed for evaluation and provide protocols with documented precision. Statistical analysis of the test results can be used to (1) assess the data quality with no use of reference models, (2) determine reference model parameters for different models and fitting methods, and (3) assess essential parts of measurement uncertainty of parameters by using their coefficients of variation. These quality measures can be used for a variety of applications, such as process quality control, regulation [8], and method development and validation.

Comparing the particle size distributions of non-touching and touching particles demonstrated that the deconvoluting routine reduced both the mean and the standard deviation for the processed data set. Self-review of particle size distribution data can be improved by the use of statistical analysis tools that quickly identify particle images that should be reviewed for consistency. The ANOVA test can be used to evaluate intralaboratory and interlaboratory data quality independent of a model choice for the distribution. If these methods are used with a reference material, then the trueness of the protocol to the value assigned to the reference material measurand can be determined.

In this interlaboratory comparison, only two of the eight labs did not reject the null hypothesis of similar frame-to-frame means for three different measurands (area-equivalent diameter, maximum Feret diameter and shape factor). Yet, the interlaboratory area-equivalent diameter mean (27.6 nm; coefficient of variation = 2.6%; expanded measurement uncertainty = 5.5%) was quite similar to that of RM8012. With respect to visualization tools, the cumulative distribution plot was used to verify general agreement between the data and model, the residual deviation plot was helpful in showing deviations near the sample mean, and the quantile plot was used to show differences near the ends of the distribution. Quasi-linear plots of the eight data sets showed that the average range for good fits between the model and the cumulative number-based distributions was −1.9σ to +2.3σ . There often were significant deviations between data and model outside of this range, suggesting a practical limit to the applicability of reference models for TEM characterization.

The RSEs of the fitted parameters provided a good starting point for evaluating intralab data quality. The RSEs aided in the selection of preferred reference models, the comparison of different measurands and the selection of the fitting methods. The RSEs did not appear to correlate with the number of frames analysed or the pixels/nm of the frame scale, which was tightly controlled. RSEs for lognormal model parameters, the mean and standard deviation, generally decreased as the number of particles measured increased. However, the standard deviation RSEs were about two orders of magnitude larger than those of the mean. Therefore, most of the error of the reference models appears to be associated with the breadths of the distributions.

Interlaboratory results were analysed by constructing grand averages of the parameter values from all labs. The coefficients of variation (as percentages) could be used to evaluate quality of the parameter estimates across the ILC. In general, the grand mean is better known than the grand standard deviation. The coefficient of variation for a parameter could be used to estimate its relative expanded measurement uncertainty as part of a measurement uncertainty budget.

Acknowledgments

Statements in this paper reflect the opinions of the authors and do not necessarily reflect the opinions of the National Institute of Standards and Technology (NIST), the National Institute for Occupational Safety and Health (NIOSH) or the US Food and Drug Administration (FDA). Certain commercial equipment, instruments or materials are identified in this paper. Such identification does not imply recommendation or endorsement by NIST, NIOSH or the FDA, nor does it imply that the products identified are necessarily the best available for the purpose.

Metrology checklist [<xref rid="R10" ref-type="bibr">10</xref>]

Metrology checklist for particle size distribution by TEM.

QuestionResponse
Is the system/body/substance that will be subjected to the measurement procedure clearly described, including its state?The objective is to measure the particle size distribution of a discrete, near-spherical nanoparticle sample.
Is the definition of the system/body/substance not unnecessarily restrictive?The definition is not unnecessarily restrictive. The protocol will be applicable to powders, dispersions and suspensions that can be dispersed on TEM grids.
Is the measurand clearly described?The number-based cumulative distribution of area-equivalent discrete particle diameters measured from TEM images (pixel-based). Fitted parameters of reference distributions (mean size and the shape of the distribution) are reported.
Has it been clearly indicated whether the measurand is operationally or method-defined, or whether the measurand is an intrinsic, structurally defined property?Yes. The measurement is performed in a vacuum, which might possibly affect the particles. For particles that are not perfectly spherical, the reported area-equivalent diameter is dependent on the orientations of the particles when deposited on the grid.
Is the measurement unit defined? Are the tools required to obtain metrological traceability available?Length. Area-equivalent diameter is one of several options. Other measurands (Feret diameters, area, perimeter, occupied area and shape factors) may provide additional information about particle shape and surface structure [20].
Has the method already been validated in one or more laboratories?No. While many journal articles report particle size distributions by TEM, this method has not been validated and reported in refereed journals. ISO standards have been developed for the area-equivalent diameter measurements of powders [17, 19, 20, 22] but do not specifically refer to nanoparticles.
What are the quality control tools available to enable the demonstration of a laboratory’s proficiency with the test method?The test method requires that the TEM has been calibrated, and that the data are analysed statistically. The statistical tools include ANOVA to assess frame-to-frame similarity of nanoparticle mean diameters, RSEs for fitted parameters of reference models and coefficients of variation for comparing parameters from the interlaboratory test.
Have results of measurements using the proposed method already been published in peer-reviewed journals by several laboratories?Yes. The protocol is based on several methods reported in the literature: a recent NIOSH interlaboratory comparison [13], a NIST protocol [14], and a generic protocol from the National Physical Laboratory [15].
Is the required instrumentation widely available?Yes. TEM is widely available, but is costly to operate. Automated image capture and image analysis methods [32] are used to improve uniformity of measurements.
Does the document propose a measurement uncertainty budget?Type A and B measurement uncertainties of the fitted parameters were assessed [30, 31, 33].
Definitions of statistical and metrological termsStatistical definitionsMean

Standard definition: the mean (or arithmetic mean) is the sum of all the values in a group (xi) divided by the number of values in that group (n). x=Σi=1nxin.

Fitted model: estimates for the fitted mean begin with the standard definition and then are iteratively updated to minimize the sum of differences between the reference model and the data. x(fit).

Standard deviation

Standard definition: the standard deviation, denoted by s or SD, represents the average amount of variability in a set of sample measurements. That is, it is the average distance of each sample measurement (xi) from the mean (). s=Σi=1n(xix)2n1.

Fitted model: estimates for the fitted mean begin with the standard definition and then are iteratively updated to minimize the sum of differences between the reference model and the data. s(fit).

Coefficient of variation

Standard definition: the coefficient of variation is also known as the unitized risk, variation coefficient or relative standard deviation. The example is for a sample mean. c^v=sx.

Fitted model c^v(fit)=s(fit)x(fit).

Standard error

Standard definition: examplestandard error of the mean. The standard error is the standard deviation of the sampling distribution of a statistic. The example is for a sample mean. Standard error of the mean is an estimate of how close the sample mean is to the population mean.

SEx=sn. This value decreases as the sample size increases.

Fitted model: computed using Wald confidence intervals SEx(fit).

Relative standard error

The RSE is the standard error divided by its statistic and expressed as a percentage.

Standard definition: example—RSE of the mean.

RSEx=SExx.

The p-value

If the null hypothesis were true and if the experiment were repeated many times, a p-value is the probability that a value at least as extreme as the computed test statistic would be observed.

Note: in hypothesis testing, a statement claiming that the null parameter is the true parameter is called the null hypothesis. The purpose of a hypothesis test is to determine whether the data provide evidence against the null hypothesis. When a statistic is obtained that is very different from the null parameter, the null hypothesis can be rejected. An alternative, or research hypothesis, is a hypothesis that states that the true parameter is not (or is less than or is greater than) the null parameter; it is the hypothesis that corresponds to the research question. The goal of a hypothesis test is to reject the null hypothesis in favour of the research hypothesis.

Bias

Bias is present when a statistic is systematically different from the population parameter it is estimating.

Δm = |cmccrm|: the absolute difference between the mean measured value and the certified value. Bias of the normal mean of this study would be the average of the individual absolute differences between a measured mean and the certified reference material mean.

bias=Σi=1nΔm,in.
Relative bias

Quotient of the bias divided by the expected value.

Variance

The variance, Var(x), between a model and data can be defined as

Var(x)=1n(xi,modelxi,data)2.
Residual deviation

The residual deviation of an observed value is the difference between the observed value of the response variable and the estimated value of the response variable.

Quantile plot

A quantile plot is a graphical method of comparing two distributions. The quantiles of the empirical (data) distribution are plotted on the y-axis while the quantiles of the theoretical (reference) distribution with the same mean and variance as the empirical distribution are plotted on the x-axis.

MeasurandsArea-equivalent diameter

Diameter of a circle that has an area equivalent to the area reported for the particle

DAE=4Aiπ.
Maximum Feret diameter

Distance between parallel tangents; corresponds to ‘length’; Df, max.

Minimum Feret diameter

Distance between parallel tangents; corresponds to ‘breadth’; Df,min.

Shape factor

Ratio of the maximum and minimum Feret diameters for a particle (inverse of aspect ratio)

φ=Df,maxDf,min.
Metrological definitionsMeasurement uncertainty

For the area-equivalent diameter, elements of the pooled measurement uncertainty (uc(x)) could include the interlaboratory reproducibility (u(ir)), the trueness (u(t)) and the image resolution error (u(c)). The image resolution error depends on the particle size, ranging from 3.3% to 1.7% to 1% for particle sizes of 15 nm, 30 nm and 50 nm.

uc(x)=u(ir)2+u(t)2+u(c)2.
Expanded measurement uncertainty

The Report of Investigation for RM8012 [23] gives the expanded measurement uncertainty for 30 nm gold nanoparticles, based on the combined standard uncertainty [34] for different ampoules of the reference material (a Type A evaluation). The expanded measurement uncertainty, U = 2.1, was computed using

U=ksampoulemeans1+1N,

where k is the coverage factor for 95% expanded uncertainty intervals (=2), sampoule means is the standard deviation of the means of the area-equivalent diameter computed for different ampoules (s = 0.94 nm), and the radical term adjusts for the number of ampoules studied (N = 4).

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General Requirements for the Competence of Reference Material Producers2009International Organization for Standardization (ISO)Geneva, SwitzerlandNIOSHNIOSH/DUNE Interlaboratory Study: Evaluation of a Sample Preparation Technique for Determination of TEM-Based Size Distribution using NIST Reference Materials 8011, 8012, and 8013: gold nanoparticles201211NIOSH/Dune SciencesBonevichJEHallerWKNISTMeasuring the size of nanoparticles using transmission electron microscopy (TEM)NIST-NCL Joint Assay Protocol, PCC-7 Version 1.1201013NIST-NCLWashington, DCBoydRDGood practice guide for the determination of the size distribution of spherical nanoparticle samplesMeasurement Good Practice Guide No 1192011National Physical LaboratoryISOISO 9276-2 Representation of Results of Particle Size Analysis—Part 2: Calculation of Average Particle Sizes/Diameters and Moments From Particle Size Distributions2001ISOGenevaISOISO 9276-3 Representation of Results of Particle Size Analysis—Part 3: Fitting of an Experimental Cumulative Curve to a Reference Model2008ISOGenevaISOISO 9276-1 Representation of Results of Particle Size Analysis—Part 1: Graphical RepresentationISOGenevaISOISO 9276-5 Representation ofResults of Particle Size Analysis—Part 5: Methods of Calculation Relating to Particle Size Analyses using Logarithmic Normal Probability Distribution200512ISOGenevaISOISO 9276-6 Representation of Results of Particle Size Analysis—Part 6: Descriptive and Quantitative Representation of Particle Shape and Morphology200823ISOGenevaISOAccuracy (Trueness and Precision) of Measurement Methods and Results—Part 1: General Principles and Definitions5725ISOGenevaISOISOISO 13322-1 Particle Size Analysis—Image Analysis Methods—Part 1: Static Image Analysis Methods200439ISOGenevaNISTReport of Investigation. Reference Material 8012. Gold Nanoparticles, Nominal 30 nm Diameter200710National Institute of Standards and TechnologyGaithersburg, MDVladarAEMingBNISTMeasuring the size of colloidal gold nano-particles using high-resolution scanning electron microscopyNIST-NCL Joint Assay Protocol, PCC-15. Version 1.1201120NIST-NCLWashington, DCMasudaHGotohKStudy on the sample size required for the estimation of mean particle diameterAdv. Powder Technol19991015973SongNWUncertainty estimation of nanoparticle size distribution from a finite number of data obtained by microscopic analysisMetrologia2009464808YoshidaHParticle size measurement of standard reference particle candidates and theoretical estimation of uncertainty regionAdv. Powder Technol2009201459YoshidaHTheoretical calculation of uncertainty region based on the general size distribution in the preparation of standard reference particles for particle size measurementAdv. 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SEM (left-hand side) and TEM (right-hand side) images of RM8012 [24]. SEM shows faceted nanoparticles. TEM shows the internal structure of a faceted gold nanoparticle.

Comparison of data for non-touching particles (solid black squares) and the Watershed algorithm for separation of touching particles (open red circles). Lab E, (a) comparison of residual deviations. (b) Comparison of quantile plot transforms. X and Y are defined by table 1 of ISO 9276-3 [15].

ANOVA boxplots comparing frame means and data ranges, Lab G. Vertical line = overall mean; solid diamond = frame mean; grey box = 25th–75th percentile for each frame (interquartile range (IQR)); black error bars = − 1.5 × IQR to + 1.5 × IQR (approximately s to + s, where is the mean of the natural log of the area-equivalent diameters); stars = extreme points beyond the black error bars.

Shape factor of gold nanoparticles. Lab H: data (open circles) fitted to a Rosin–Rammler–Bennett model (solid red line). For fitting purposes, the shape factor (SF) was transformed to SFt = 1 − SF.

RSE of the sample means and standard deviations for all labs. Lognormal model parameters for the area-equivalent diameter distribution; open squares = standard deviation, open circles = mean.

Comparison of fitting methods (lognormal distribution). Lab B: data = open squares. (a1) ANOVA means for each frame (see figure 3 caption for symbol descriptions), (a2) cumulative distribution fit (solid red curve), (a3) residual deviation data, (a4) quasi-linear regression fit (solid red curve); Lab F: (b1) ANOVA means for each frame, (b2) cumulative distribution fit (solid red curve), (b3) residual deviation fit, (b4) quasi-linear regression fit (lognormal model = solid red curve; normal model = double black curve).

Instrument factors.

OrganizationABCDEFGH
# of frames  analysed62492027111352055
# of nanoparticles  analysed70662453551360811121480531
InstrumentJEOL JEM 2100JEOL 2000 FXJeol JEM 1011JEOL 1011Jeol JEM 1220FEI Titan 80-300FEI Tecnai G2 TwinJEOL 2010F
Acceleration  voltage200 kV200 keV80 kV100 kV80 kV300 kV200 kV120 kV
Magnification20 000×21 000× nominal (~153 300× at camera)100 000×20 000×40 000×27 000×19 000×, 25000×, 29 000×20 000×
Frame size1040 nm1217.6 nm× 811.2 nm1320 nm× 1700 nm550 nm× 550 nm1000 nm× 1400 nm782 nm× 782 nm1875 nm× 1875 nm475 nm× 475 nm
Pixel dimension0.51 nm/pixel0.30 nm/pixel0.51 nm/pixel0.50 nm/pixel0.53 nm/pixel0.38 nm/pixel0.5 nm/pixel0.50 nm/pixel
Image acquisition  time per frame3 s4 s5 s4 s3.5 s0.5 s3 s3 s
Mean signal-to-noise  ratio between  background  and particle~2.5~14.22~2.42~22~2.5
Image analysis  softwareImage JImage JImage JImage JImage JImage JImage JImage J

ANOVA for the natural logarithm of three measurands: (A) area-equivalent diameter, (B) maximum Feret diameter and (C) shape factor. The p-values rejecting the null hypothesis of all frames having equal means are italicized (p < 0.05).

(A) Natural log of area equivalent
Area-equivalent diameter/nm
Laboratory xln(nm) s/ln(nm)p-value

A3.340.00660.71128.6
B3.330.0030 0.0001 27.9
C3.330.00360.27427.9
D3.270.00670.16826.4
E3.280.0031 0.0010 26.7
F3.330.0023 0.0026 28.0
G3.310.0026<0.000127.5
H3.310.00380.10627.4

(B) Natural log of Feret diameter
Feret diameter/nm
Laboratory xln(nm) s/ln(nm)p-value

A3.430.00690.75831.2
B3.400.0035 0.0005 30.1
C3.410.00430.34230.5
D3.360.00650.41329.0
E3.400.0033<0.000130.2
F3.430.00300.13830.9
G3.420.0027<0.000130.6
H3.390.0040 0.0054 29.8

(C) Natural log of aspect ratio
Mean aspect ratio
Laboratory x s p-value

A0.1000.00360.9041.11
B0.0980.00340.3511.11
C0.1230.0065<0.00011.15
D0.1070.00420.2901.12
E0.1070.0041 0.0003 1.12
F0.1090.00350.9611.12
G0.1080.0027 0.0051 1.12
H0.0890.0032 0.0459 1.10

Coefficients of variation for the interlaboratory comparison. Measurand = area-equivalent diameter; normal distribution is assumed.

Normal distributionModel parameters
Reported range/nm
xnm s/nm D a-e,min D a-e,max
RM801227.6
Lab
A28.63.1721.970.7
B28.12.1721.637.7
C27.92.3022.336.7
D26.52.6119.651.2
E26.72.0315.933.0
F28.02.1921.735.2
G27.62.6013.945.4
H27.42.4720.840.4
x of parameter27.62.4419.743.8
s of parameter0.7080.3613.1312.4
c^v of parameter2.57%14.8%15.9%28.2%

Relative bias for the interlaboratory comparison (expressed as a percentage). Measurand = area-equivalent diameter; normal distribution is assumed, c^v = 27.6 nm for RM8012.

Lab Δ m
A1.0
B0.5
C0.3
D1.1
E0.9
F0.4
G0.0
H0.2
Bias0.55
Relative bias2.0%

RSEs of fitted parameters: (A) lognormal distribution and (B) normal distribution.

Mean
Standard deviation
x(fit)ln(nm) SEx(fit) RSEx(fit) s(fit)/ln(nm)SEs(fit)RSEs(fit) R 2

(A) ln(Da–e)Lab
A3.341.32E–043.95E–050.08062.31E–042.87E–030.998
B3.321.69E–045.09E–050.07202.99E–044.16E–030.996
C3.329.19E–052.76E–050.07981.66E–042.02E–030.999
D3.271.13E–043.45E–050.08232.01E–042.44E–030.999
E3.289.55E–052.91E–050.07361.65E–042.24E–030.999
F3.335.92E–051.78E–050.07081.05E–041.48E–030.999
G3.316.25E–051.89E–050.07451.13E–041.52E–030.999
H3.302.41E–047.30E–050.08114.26E–045.24E–030.995
x of parameter 3.31 3.64E–05 0.0768 2.75E–03 0.998
s of parameter 2.53E–02 1.83E–05 4.58E–03 1.32E–03 1.53E–03

x(fit)nm SEx(fit) RSEx(fit) s(fit)/nmSEs(fit)RSEs(fit) R 2

(B) Da–eLab
A28.35.34E–031.88E–042.279.18E–034.04E–030.996
B27.95.86E–032.10E–042.011.04E–025.18E–030.994
C27.82.70E–039.71E–052.214.72E–032.14E–030.999
D26.33.89E–031.48E–042.156.91E–033.21E–030.998
E26.63.52E–031.32E–041.966.10E–033.11E–030.998
F27.82.45E–038.80E–051.974.35E–032.21E–030.998
G27.52.06E–037.50E–052.043.72E–031.82E–030.999
H27.18.25E–033.04E–042.191.46E–026.65E–030.993
x of parameter 27.4 1.55E–0.4 2.10 3.55E–03 0.997
s of parameter 7.07E–01 7.67E–05 1.21E–01 1.67E–03 2.38E–03

Comparison of fitted parameters and standard definitions for all labs (grand means, grand standard deviations and their coefficients of variation): (A) lognormal distribution and (B) normal distribution.

x(fit)ln(nm) s(fit)/ln(nm) xln(nm) s/ln(nm)

(A) Lognormal distribution
Grand x of parameter3.310.07683.310.0836
Grand s of parameter.02530.004 580.09140.008 33
Grand CoV of parameter0.764%5.96%2.76%9.96%

x(fit)nm s(fit)/nm xnm s/nm

(B) Normal distribution
Grand x of parameter27.42.1027.62.46
Grand s of parameter0.7070.1210.7210.392
Grand CoV of parameter2.58%5.76%2.61%15.9%